| rdf:type | <https://jpsearch.go.jp/term/type/図書> |
| rdfs:label | "Noncontact atomic force microscopy Volume 3" |
| schema:name | "Noncontact atomic force microscopy Volume 3" |
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| schema:about | <http://id.ndl.go.jp/class/ndlc/ND448> (➜ "電気工学--電子工学--電子応用機器--電子顕微鏡") |
| schema:contributor | <https://jpsearch.go.jp/entity/ncname/SeizoMorita,FranzJ.Giessibl,-g119705449> (➜ "Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger (ed.)") |
| schema:datePublished | "2015" |
| schema:description 4 | "書誌ID: 026348259" |
| schema:description | "著者: Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger, editors" |
| schema:description | "シリーズタイトル: Nanoscience and technology" |
| schema:description | "数量・大きさ等: xxii, 527 pages ; 25 cm" |
| schema:identifier 2 | "ISBN:9783319155883" |
| schema:identifier | "ISBN:9783319155876" |
| schema:inLanguage | <http://id.loc.gov/vocabulary/iso639-2/eng> (➜ "英語") |
| schema:isbn 2 | "9783319155876" |
| schema:isbn | "9783319155883" |
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| schema:temporal | <https://jpsearch.go.jp/entity/time/2015> (➜ "2015年") |