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| rdfs:label | "Metrology and standardization for nanotechnology : protocols and industrial innovations" |
| schema:name | "Metrology and standardization for nanotechnology : protocols and industrial innovations" |
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| schema:about | <http://id.ndl.go.jp/class/ndlc/M21> (➜ "科学技術一般") |
| schema:contributor | <https://jpsearch.go.jp/entity/ncname/ElisabethMansfield,DebraL.Ka-g1633611549> (➜ "Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde (ed.)") |
| schema:datePublished | "2017" |
| schema:description 4 | "著者: edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde" |
| schema:description | "書誌ID: 028025078" |
| schema:description | "数量・大きさ等: xxxii, 594 pages : illustrations, charts (some color) ; 25 cm" |
| schema:description | "シリーズタイトル: Nanotechnology innovation & applications" |
| schema:identifier | "ISBN:9783527340392" |
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| schema:isbn | "9783527340392" |
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