rdf:type | <https://jpsearch.go.jp/term/type/図書> |
rdfs:label | "Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis" |
schema:name | "Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis" |
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schema:about | <http://id.ndl.go.jp/class/ndlc/ND448> (➜ "電気工学--電子工学--電子応用機器--電子顕微鏡") |
schema:creator | <https://jpsearch.go.jp/entity/ncname/editor,_Nobuo_Tanaka> (➜ "editor, Nobuo Tanaka") |
schema:datePublished | "2015" |
schema:description 2 | "数量・大きさ等: xliv, 571 pages : illustrations (some color) ; 24 cm" |
schema:description | "書誌ID: 025822343" |
schema:identifier | "ISBN:9781848167896" |
schema:inLanguage | <http://id.loc.gov/vocabulary/iso639-2/eng> (➜ "英語") |
schema:isbn | "9781848167896" |
schema:publisher | <https://jpsearch.go.jp/entity/ncname/Imperial_College_Press> (➜ "Imperial College Press") |
schema:spatial | <https://jpsearch.go.jp/entity/place/イギリス> |
schema:temporal | <https://jpsearch.go.jp/entity/time/2015> (➜ "2015年") |