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| rdfs:label | "Integrated imaging and vision techniques for industrial inspection : advances and applications" |
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| schema:about | <http://id.ndl.go.jp/class/ndlc/M291> (➜ "工業基礎学--管理工学--品質管理") |
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| schema:datePublished | "2015" |
| schema:description 4 | "著者: Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel, editors" |
| schema:description | "数量・大きさ等: x, 541 pages : illustrations (some color) ; 25 cm" |
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| schema:description | "シリーズタイトル: Advances in computer vision and pattern recognition" |
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